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RF-MEMS design for reliability

dc.contributor.authorRottenberg, Xavier
dc.contributor.authorDe Raedt, Walter
dc.contributor.authorTilmans, Harrie
dc.contributor.authorDe Wolf, Ingrid
dc.date.accessioned2021-10-17T10:18:26Z
dc.date.available2021-10-17T10:18:26Z
dc.date.issued2008
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14396
dc.sourceIIOimport
dc.titleRF-MEMS design for reliability
dc.typeOral presentation
dc.contributor.imecauthorRottenberg, Xavier
dc.contributor.imecauthorDe Raedt, Walter
dc.contributor.imecauthorTilmans, Harrie
dc.contributor.imecauthorDe Wolf, Ingrid
dc.contributor.orcidimecDe Raedt, Walter::0000-0002-7117-7976
dc.contributor.orcidimecTilmans, Harrie::0000-0003-4240-4962
dc.contributor.orcidimecDe Wolf, Ingrid::0000-0003-3822-5953
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.conference19th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
dc.source.conferencedate29/09/2008
dc.source.conferencelocationMaastricht The Netherlands
imec.availabilityPublished - open access
imec.internalnotesTutorial T3


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