dc.contributor.author | Rousselet, S. | |
dc.contributor.author | David, M.L. | |
dc.contributor.author | Beaufort, M.F. | |
dc.contributor.author | Pailloux, F. | |
dc.contributor.author | Barbot, J.F. | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Claeys, Cor | |
dc.date.accessioned | 2021-10-17T10:19:43Z | |
dc.date.available | 2021-10-17T10:19:43Z | |
dc.date.issued | 2008 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/14400 | |
dc.source | IIOimport | |
dc.title | Extended defects created by helium implantation at different temperature in germanium | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.source.peerreview | no | |
dc.source.conference | International Conference on Extended Defects in Semiconductors - EDS | |
dc.source.conferencedate | 14/09/2008 | |
dc.source.conferencelocation | Poitiers France | |
imec.availability | Published - imec | |