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Impact of Fe and Cu contamination on the minority carrier lifetime of silicon substrates

dc.contributor.authorRotondaro, Antonio
dc.contributor.authorHurd, Trace
dc.contributor.authorKaniava, Arvydas
dc.contributor.authorVanhellemont, Jan
dc.contributor.authorSimoen, Eddy
dc.contributor.authorHeyns, Marc
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-09-29T15:19:42Z
dc.date.available2021-09-29T15:19:42Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1440
dc.sourceIIOimport
dc.titleImpact of Fe and Cu contamination on the minority carrier lifetime of silicon substrates
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorHeyns, Marc
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage3014
dc.source.endpage3019
dc.source.journalJournal of the Electrochemical Society
dc.source.issue9
dc.source.volume143
imec.availabilityPublished - open access


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