Impact of Fe and Cu contamination on the minority carrier lifetime of silicon substrates

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Authors

Rotondaro, Antonio; Hurd, Trace; Kaniava, Arvydas; Vanhellemont, Jan; Simoen, Eddy; Heyns, Marc; Claeys, Cor

Issue

9

Journal

Journal of the Electrochemical Society

Volume

143

Title

Impact of Fe and Cu contamination on the minority carrier lifetime of silicon substrates

Publication type

Journal article

Embargo date

9999-12-31

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