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Impact of Fe and Cu contamination on the minority carrier lifetime of silicon substrates
Publication:
Impact of Fe and Cu contamination on the minority carrier lifetime of silicon substrates
Date
1996
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Rotondaro, Antonio
;
Hurd, Trace
;
Kaniava, Arvydas
;
Vanhellemont, Jan
;
Simoen, Eddy
;
Heyns, Marc
;
Claeys, Cor
Journal
Journal of the Electrochemical Society
Abstract
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2037
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations
Metrics
Views
2037
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations