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The impact of Fe and Cu contamination in the 1012 at/cm2 range on the performance of junction diodes

dc.contributor.authorRotondaro, Antonio
dc.contributor.authorVandamme, Ewout
dc.contributor.authorVanhellemont, Jan
dc.contributor.authorSimoen, Eddy
dc.contributor.authorHeyns, Marc
dc.contributor.authorClaeys, C.
dc.date.accessioned2021-09-29T15:19:49Z
dc.date.available2021-09-29T15:19:49Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1441
dc.sourceIIOimport
dc.titleThe impact of Fe and Cu contamination in the 1012 at/cm2 range on the performance of junction diodes
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorHeyns, Marc
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage397
dc.source.endpage402
dc.source.conferenceProceedings of the 6th Autumn Meeting Gettering and Defect Engineering in Semiconductor Technology - GADEST'95
dc.source.conferencedate2/09/1995
dc.source.conferencelocationBerlin Germany
imec.availabilityPublished - open access
imec.internalnotesSolid State Phenomena; Vols. 47-48


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