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Influence of kink effect on noise measurements at microwave frequencies in InP substrate PHEMTs
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Authors
Rouquette, P.
;
Gasquet, D.
;
Barberousse, F.
;
De Raedt, Walter
;
Baeyens, Yves
Conference
Proceedings 3rd ELEN Workshop
Title
Influence of kink effect on noise measurements at microwave frequencies in InP substrate PHEMTs
Publication type
Proceedings paper
Embargo date
9999-12-31
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