dc.contributor.author | Sarkar, Subhendu | |
dc.contributor.author | Franquet, Alexis | |
dc.contributor.author | Moussa, Alain | |
dc.contributor.author | Vandervorst, Wilfried | |
dc.date.accessioned | 2021-10-17T10:28:37Z | |
dc.date.available | 2021-10-17T10:28:37Z | |
dc.date.issued | 2008 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/14425 | |
dc.source | IIOimport | |
dc.title | Chemical contributions of low-energy ion beams towards ripple formation: A mixed beam experimental study | |
dc.type | Meeting abstract | |
dc.contributor.imecauthor | Franquet, Alexis | |
dc.contributor.imecauthor | Moussa, Alain | |
dc.contributor.imecauthor | Vandervorst, Wilfried | |
dc.contributor.orcidimec | Franquet, Alexis::0000-0002-7371-8852 | |
dc.contributor.orcidimec | Moussa, Alain::0000-0002-6377-4199 | |
dc.source.peerreview | no | |
dc.source.beginpage | p39 | |
dc.source.conference | 6th European Workshop on Secondary Ion Mass Spectrometry - SIMS Europe | |
dc.source.conferencedate | 14/09/2008 | |
dc.source.conferencelocation | Münster Germany | |
imec.availability | Published - imec | |