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Influence of the kink effect on noise measurements in InP substrate PHEMTs at microwave frequencies
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Authors
Rouquette, P.
;
Gasquet, D.
;
Barberousse, F.
;
De Raedt, Walter
;
Baeyens, Yves
Issue
10
Journal
Solid-State Electronics
Volume
39
Title
Influence of the kink effect on noise measurements in InP substrate PHEMTs at microwave frequencies
Publication type
Journal article
Embargo date
9999-12-31
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