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Influence of the kink effect on noise measurements in InP substrate PHEMTs at microwave frequencies

dc.contributor.authorRouquette, P.
dc.contributor.authorGasquet, D.
dc.contributor.authorBarberousse, F.
dc.contributor.authorDe Raedt, Walter
dc.contributor.authorBaeyens, Yves
dc.date.accessioned2021-09-29T15:20:03Z
dc.date.available2021-09-29T15:20:03Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1443
dc.sourceIIOimport
dc.titleInfluence of the kink effect on noise measurements in InP substrate PHEMTs at microwave frequencies
dc.typeJournal article
dc.contributor.imecauthorDe Raedt, Walter
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage1423
dc.source.endpage6
dc.source.journalSolid-State Electronics
dc.source.issue10
dc.source.volume39
imec.availabilityPublished - open access


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