dc.contributor.author | Scholz, Mirko | |
dc.contributor.author | Linten, Dimitri | |
dc.contributor.author | Thijs, Steven | |
dc.contributor.author | Sawada, Masanori | |
dc.contributor.author | Nakaei, Toshiyuki | |
dc.contributor.author | Hasebe, Takumi | |
dc.contributor.author | Groeseneken, Guido | |
dc.date.accessioned | 2021-10-17T10:33:59Z | |
dc.date.available | 2021-10-17T10:33:59Z | |
dc.date.issued | 2008-10 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/14440 | |
dc.source | IIOimport | |
dc.title | On-wafer human metal model – system-level ESD stress on component level | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Linten, Dimitri | |
dc.contributor.imecauthor | Thijs, Steven | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
dc.contributor.orcidimec | Thijs, Steven::0000-0003-2889-8345 | |
dc.contributor.orcidimec | Groeseneken, Guido::0000-0003-3763-2098 | |
dc.source.peerreview | no | |
dc.source.conference | RCJ ESD Symposium | |
dc.source.conferencedate | 30/10/2008 | |
dc.source.conferencelocation | Tokyo Japan | |
imec.availability | Published - imec | |