A compact model for the grounded-gate nMOS behaviour under CDM ESD stress

Thumbnail
View/open
Metadata
Show full item record
Authors
Russ, Christian; Verhaege, Koen; Bock, Karlheinz; Roussel, Philippe; Groeseneken, Guido; Maes, Herman
Conference
Proceedings of 18th Annual Electrical Overstress/Electrostatic Discharge Symposium
Title
A compact model for the grounded-gate nMOS behaviour under CDM ESD stress
Publication type
Proceedings paper
Embargo date
9999-12-31
Collections