Publication:

A compact model for the grounded-gate nMOS behaviour under CDM ESD stress

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1965 since deposited on 2021-09-29
Acq. date: 2025-10-23

Citations

Metrics

Views

1965 since deposited on 2021-09-29
Acq. date: 2025-10-23

Citations