Electrical activity of dislocations and defects in strained Si and Ge based devices

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Authors
Simoen, Eddy; Eneman, Geert; Verheyen, Peter; Loo, Roger; Bargallo Gonzalez, Mireia; Claeys, Cor
Conference
214th ECS Meeting
Title
Electrical activity of dislocations and defects in strained Si and Ge based devices
Publication type
Meeting abstract
Embargo date
9999-12-31
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