Evaluation of transmission line model structures for silicide-to-silicon specific contact resistance extraction
dc.contributor.author | Stavitski, Natalie | |
dc.contributor.author | Van Dal, Mark J.H. | |
dc.contributor.author | Lauwers, Anne | |
dc.contributor.author | Vrancken, Christa | |
dc.contributor.author | Kovalgin, Alexey Y. | |
dc.contributor.author | Wolters, Rob A.M. | |
dc.date.accessioned | 2021-10-17T11:00:44Z | |
dc.date.available | 2021-10-17T11:00:44Z | |
dc.date.issued | 2008 | |
dc.identifier.issn | 0018-9383 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/14513 | |
dc.source | IIOimport | |
dc.title | Evaluation of transmission line model structures for silicide-to-silicon specific contact resistance extraction | |
dc.type | Journal article | |
dc.contributor.imecauthor | Lauwers, Anne | |
dc.contributor.imecauthor | Vrancken, Christa | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 1170 | |
dc.source.endpage | 1176 | |
dc.source.journal | IEEE Transactions on Electron Devices | |
dc.source.issue | 5 | |
dc.source.volume | 55 | |
imec.availability | Published - open access |