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Inductor-based ESD protection under CDM-like ESD stress conditions for RF applications

dc.contributor.authorThijs, Steven
dc.contributor.authorOkushima, Mototsugu
dc.contributor.authorBorremans, Jonathan
dc.contributor.authorJansen, Philippe
dc.contributor.authorLinten, Dimitri
dc.contributor.authorScholz, Mirko
dc.contributor.authorWambacq, Piet
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-17T11:12:32Z
dc.date.available2021-10-17T11:12:32Z
dc.date.issued2008
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14546
dc.sourceIIOimport
dc.titleInductor-based ESD protection under CDM-like ESD stress conditions for RF applications
dc.typeProceedings paper
dc.contributor.imecauthorThijs, Steven
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorWambacq, Piet
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecThijs, Steven::0000-0003-2889-8345
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecWambacq, Piet::0000-0003-4388-7257
dc.source.peerreviewno
dc.source.beginpage49
dc.source.endpage52
dc.source.conferenceIEEE Custom Integrated Circuits Conference - CICC
dc.source.conferencedate21/09/2008
dc.source.conferencelocationSan Jose, CA USA
imec.availabilityPublished - imec


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