Characterization and optimization of sub-32nm FinFET devices for ESD applications

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Authors

Thijs, Steven; Tremouilles, David; Russ, Christian; Griffoni, Alessio; Collaert, Nadine; Rooyackers, Rita; Linten, Dimitri; Scholz, Mirko; Duvvury, Charvaka; Gossner, Harald; Jurczak, Gosia; Groeseneken, Guido

ISSN

0018-9383

Issue

12

Journal

IEEE Transactions on Electron Devices

Volume

55

Title

Characterization and optimization of sub-32nm FinFET devices for ESD applications

Publication type

Journal article

Embargo date

9999-12-31

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