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Characterization and optimization of sub-32nm FinFET devices for ESD applications
Publication:
Characterization and optimization of sub-32nm FinFET devices for ESD applications
Date
2008
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Thijs, Steven
;
Tremouilles, David
;
Russ, Christian
;
Griffoni, Alessio
;
Collaert, Nadine
;
Rooyackers, Rita
;
Linten, Dimitri
;
Scholz, Mirko
;
Duvvury, Charvaka
;
Gossner, Harald
;
Jurczak, Gosia
;
Groeseneken, Guido
Journal
IEEE Transactions on Electron Devices
Abstract
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1912
since deposited on 2021-10-17
Acq. date: 2025-10-24
Citations
Metrics
Views
1912
since deposited on 2021-10-17
Acq. date: 2025-10-24
Citations