Characterization and optimization of sub-32nm FinFET devices for ESD applications

Thijs, Steven; Tremouilles, David; Russ, Christian; Griffoni, Alessio; Collaert, Nadine; Rooyackers, Rita; Linten, Dimitri; Scholz, Mirko; Duvvury, Charvaka; Gossner, Harald; Jurczak, Gosia; Groeseneken, Guido

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Characterization and optimization of sub-32nm FinFET devices for ESD applications

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2008

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IEEE Transactions on Electron Devices

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Characterization and optimization of sub-32nm FinFET devices for ESD applications

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