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Nitride engineering for improved erase performance and retention of TANOS NAND Flash memory

dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorFurnemont, Arnaud
dc.contributor.authorZahid, Mohammed
dc.contributor.authorDegraeve, Robin
dc.contributor.authorBreuil, Laurent
dc.contributor.authorCacciato, Antonio
dc.contributor.authorRothschild, Aude
dc.contributor.authorOlsen, Chris
dc.contributor.authorGanguly, Udayan
dc.contributor.authorVan Houdt, Jan
dc.date.accessioned2021-10-17T11:42:00Z
dc.date.available2021-10-17T11:42:00Z
dc.date.issued2008-05
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14625
dc.sourceIIOimport
dc.titleNitride engineering for improved erase performance and retention of TANOS NAND Flash memory
dc.typeProceedings paper
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.imecauthorFurnemont, Arnaud
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorBreuil, Laurent
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.contributor.orcidimecFurnemont, Arnaud::0000-0002-6378-1030
dc.contributor.orcidimecBreuil, Laurent::0000-0003-2869-1651
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.source.peerreviewyes
dc.source.beginpage128
dc.source.endpage129
dc.source.conferenceJoint Non-volatile Semiconductor Memory Workshop / International Conference on Memory Technology and Design
dc.source.conferencedate18/05/2008
dc.source.conferencelocationOpio France
imec.availabilityPublished - imec


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