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A load-pull wafer-mapper

dc.contributor.authorVanaverbeke, Fre
dc.contributor.authorVaesen, Kristof
dc.contributor.authorXiao, Dongping
dc.contributor.authorPauwels, Luc
dc.contributor.authorDe Raedt, Walter
dc.contributor.authorGermain, Marianne
dc.contributor.authorDegroote, Stefan
dc.contributor.authorDas, Jo
dc.contributor.authorDerluyn, Joff
dc.contributor.authorSchreurs, Dominique
dc.date.accessioned2021-10-17T12:07:34Z
dc.date.available2021-10-17T12:07:34Z
dc.date.issued2008
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14691
dc.sourceIIOimport
dc.titleA load-pull wafer-mapper
dc.typeProceedings paper
dc.contributor.imecauthorVaesen, Kristof
dc.contributor.imecauthorPauwels, Luc
dc.contributor.imecauthorDe Raedt, Walter
dc.contributor.imecauthorSchreurs, Dominique
dc.contributor.orcidimecVaesen, Kristof::0000-0001-9971-3593
dc.contributor.orcidimecDe Raedt, Walter::0000-0002-7117-7976
dc.source.peerreviewno
dc.source.beginpage113
dc.source.endpage119
dc.source.conferenceIEEE MTT-S International Microwave Symposium Digest
dc.source.conferencedate15/06/2008
dc.source.conferencelocationAtlanta, GA USA
imec.availabilityPublished - imec


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