dc.contributor.author | Vandervorst, Wilfried | |
dc.contributor.author | Meuris, Marc | |
dc.contributor.author | De Wolf, P. | |
dc.contributor.author | Alvarez, D. | |
dc.contributor.author | Hantschel, Thomas | |
dc.contributor.author | Trenkler, T. | |
dc.contributor.author | Fouchier, M. | |
dc.contributor.author | Duhayon, Natasja | |
dc.contributor.author | Polspoel, Wouter | |
dc.contributor.author | Mody, Jay | |
dc.date.accessioned | 2021-10-17T12:14:11Z | |
dc.date.available | 2021-10-17T12:14:11Z | |
dc.date.issued | 2008 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/14708 | |
dc.source | IIOimport | |
dc.title | Probing electrical properties of semiconductor structures on the nm-scale | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | Vandervorst, Wilfried | |
dc.contributor.imecauthor | Meuris, Marc | |
dc.contributor.imecauthor | Hantschel, Thomas | |
dc.contributor.imecauthor | Duhayon, Natasja | |
dc.contributor.orcidimec | Meuris, Marc::0000-0002-9580-6810 | |
dc.contributor.orcidimec | Hantschel, Thomas::0000-0001-9476-4084 | |
dc.source.peerreview | no | |
dc.source.conference | Seeing at the Nanoscale VI | |
dc.source.conferencedate | 9/07/2008 | |
dc.source.conferencelocation | Berlin Germany | |
imec.availability | Published - imec | |