dc.contributor.author | Verleysen, Eveline | |
dc.contributor.author | Richard, Olivier | |
dc.contributor.author | Bender, Hugo | |
dc.contributor.author | Schryvers, Dominique | |
dc.contributor.author | Vandervorst, Wilfried | |
dc.date.accessioned | 2021-10-17T12:32:42Z | |
dc.date.available | 2021-10-17T12:32:42Z | |
dc.date.issued | 2008-09 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/14751 | |
dc.source | IIOimport | |
dc.title | Chemical analysis of nickel silicides with high spatial resolution by combined EDS and EELS (ELNES) | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Richard, Olivier | |
dc.contributor.imecauthor | Bender, Hugo | |
dc.contributor.imecauthor | Vandervorst, Wilfried | |
dc.contributor.orcidimec | Richard, Olivier::0000-0002-3994-8021 | |
dc.source.peerreview | no | |
dc.source.beginpage | 455 | |
dc.source.endpage | 456 | |
dc.source.conference | 14th European Microscopy Congress | |
dc.source.conferencedate | 1/09/2008 | |
dc.source.conferencelocation | Aachen Germany | |
imec.availability | Published - imec | |