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RTS noise in submicron MOSFETs

dc.contributor.authorSikula, J.
dc.contributor.authorHruska, P.
dc.contributor.authorVasina, Petr
dc.contributor.authorClaeys, C.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorStadalnikas, A.
dc.date.accessioned2021-09-29T15:24:31Z
dc.date.available2021-09-29T15:24:31Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1477
dc.sourceIIOimport
dc.titleRTS noise in submicron MOSFETs
dc.typeOral presentation
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.conference20th Workshop; May 19-22, 1996; Vilnius, Lithuania.
dc.source.conferencelocation
imec.availabilityPublished - imec


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