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Analyzing the collapse force determined using lateral force AFM using

dc.contributor.authorWostyn, Kurt
dc.contributor.authorKim, Tae-Gon
dc.contributor.authorPark, Jin-Goo
dc.contributor.authorMertens, Paul
dc.date.accessioned2021-10-17T12:50:27Z
dc.date.available2021-10-17T12:50:27Z
dc.date.issued2008
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14794
dc.sourceIIOimport
dc.titleAnalyzing the collapse force determined using lateral force AFM using
dc.typeMeeting abstract
dc.contributor.imecauthorWostyn, Kurt
dc.contributor.imecauthorMertens, Paul
dc.contributor.orcidimecWostyn, Kurt::0000-0003-3995-0292
dc.source.peerreviewno
dc.source.conferenceUltra Clean Processing of Semiconductor Surfaces 2008
dc.source.conferencedate22/09/2008
dc.source.conferencelocationBrugge Belgium
imec.availabilityPublished - imec


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