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Impact of the substrate quality on the low frequency noise of silicon diodes

dc.contributor.authorSimoen, Eddy
dc.contributor.authorBosman, Gijs
dc.contributor.authorVanhellemont, Jan
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-09-29T15:24:55Z
dc.date.available2021-09-29T15:24:55Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1480
dc.sourceIIOimport
dc.titleImpact of the substrate quality on the low frequency noise of silicon diodes
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.beginpage96
dc.source.endpage104
dc.source.conference6th Quantum 1/f Noise and Other Low frequency Fluctuations in Electronic Devices Symposium
dc.source.conferencedate27/05/1994
dc.source.conferencelocationSt. Louis, MO USA
imec.availabilityPublished - imec
imec.internalnotesAIP Conference Proceedings; Vol. 371


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