dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Bosman, Gijs | |
dc.contributor.author | Vanhellemont, Jan | |
dc.contributor.author | Claeys, Cor | |
dc.date.accessioned | 2021-09-29T15:24:55Z | |
dc.date.available | 2021-09-29T15:24:55Z | |
dc.date.issued | 1996 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/1480 | |
dc.source | IIOimport | |
dc.title | Impact of the substrate quality on the low frequency noise of silicon diodes | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.source.peerreview | no | |
dc.source.beginpage | 96 | |
dc.source.endpage | 104 | |
dc.source.conference | 6th Quantum 1/f Noise and Other Low frequency Fluctuations in Electronic Devices Symposium | |
dc.source.conferencedate | 27/05/1994 | |
dc.source.conferencelocation | St. Louis, MO USA | |
imec.availability | Published - imec | |
imec.internalnotes | AIP Conference Proceedings; Vol. 371 | |