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Deterministic scan-chain diagnosis for intermittent faults

dc.contributor.authorAdolfsson, Dan
dc.contributor.authorSiew, Joanna
dc.contributor.authorLarsson, Erik
dc.contributor.authorMarinissen, Erik Jan
dc.date.accessioned2021-10-17T21:17:11Z
dc.date.available2021-10-17T21:17:11Z
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14871
dc.sourceIIOimport
dc.titleDeterministic scan-chain diagnosis for intermittent faults
dc.typeProceedings paper
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.source.peerreviewyes
dc.source.conferenceIEEE European Test Symposium
dc.source.conferencedate26/05/2009
dc.source.conferencelocationSevilla Spain
imec.availabilityPublished - imec
imec.internalnotesPoster, only available on post-symposium CD-ROM


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