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The "U" shape behavior of GIFBE in function of back gate bias in FinFETs

dc.contributor.authorAgopian, Paula G.
dc.contributor.authorMartino, Joao Antonio
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-17T21:17:27Z
dc.date.available2021-10-17T21:17:27Z
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14886
dc.sourceIIOimport
dc.titleThe "U" shape behavior of GIFBE in function of back gate bias in FinFETs
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage317
dc.source.endpage320
dc.source.conferenceSilicon-on-Insulator Technology and Devices 14
dc.source.conferencedate24/05/2009
dc.source.conferencelocationSan Francisco, CA USA
imec.availabilityPublished - open access
imec.internalnotesECS Transactions; Vol. 19, Iss. 4


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