Gate induced floating body effect behavior in uniaxially strained SOI nMOSFETs
dc.contributor.author | Agopian, Paula G.D. | |
dc.contributor.author | Pacheco, Vinicius H. | |
dc.contributor.author | Martino, Joao A. | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Claeys, Cor | |
dc.date.accessioned | 2021-10-17T21:17:28Z | |
dc.date.available | 2021-10-17T21:17:28Z | |
dc.date.issued | 2009 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/14887 | |
dc.source | IIOimport | |
dc.title | Gate induced floating body effect behavior in uniaxially strained SOI nMOSFETs | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 39 | |
dc.source.endpage | 40 | |
dc.source.conference | 5th EUROSOI Workshop | |
dc.source.conferencedate | 19/01/2009 | |
dc.source.conferencelocation | Göteborg Sweden | |
imec.availability | Published - imec |