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Conference contributions
Spacer etch process for self-aligned bouble patterning of 32nm half-pitch
Publication:
Spacer etch process for self-aligned bouble patterning of 32nm half-pitch
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Date
2009
Meeting abstract
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18137.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Altamirano Sanchez, Efrain
;
Vandeweyer, Tom
;
Dekkers, Harold
;
Vangoidsenhoven, Diziana
;
Boullart, Werner
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1776
since deposited on 2021-10-17
Acq. date: 2025-12-16
Citations
Metrics
Views
1776
since deposited on 2021-10-17
Acq. date: 2025-12-16
Citations