New insights into the wide ID range Channel Hot-Carrier degradation in high-k based devices

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Authors
Amat, Esteve; Rodríguez, Rosana; Nafria, Montse; Aymerich, Xavier; Kauerauf, Thomas; Degraeve, Robin; Groeseneken, Guido
Conference
47th Annual IEEE International Reliability Physics Symposium - IRPS
Title
New insights into the wide ID range Channel Hot-Carrier degradation in high-k based devices
Publication type
Proceedings paper
Embargo date
9999-12-31
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