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Empirical 1/f noise model for polysilicon emitter bipolar junction transistors

dc.contributor.authorSimoen, Eddy
dc.contributor.authorDecoutere, Stefaan
dc.contributor.authorDeferm, Ludo
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-09-29T15:26:04Z
dc.date.available2021-09-29T15:26:04Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1489
dc.sourceIIOimport
dc.titleEmpirical 1/f noise model for polysilicon emitter bipolar junction transistors
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.imecauthorDeferm, Ludo
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage3
dc.source.endpage8
dc.source.conferenceProceedings 3rd ELEN Workshop
dc.source.conferencedate5/11/1996
dc.source.conferencelocationLeuven Belgium
imec.availabilityPublished - open access


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