dc.contributor.author | Arstila, Kai | |
dc.contributor.author | Brijs, Bert | |
dc.contributor.author | Giangrandi, Simone | |
dc.contributor.author | Hantschel, Thomas | |
dc.contributor.author | Vandervorst, Wilfried | |
dc.date.accessioned | 2021-10-17T21:18:17Z | |
dc.date.available | 2021-10-17T21:18:17Z | |
dc.date.issued | 2009 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/14912 | |
dc.source | IIOimport | |
dc.title | Analysis of nanoparticles with elastic recoil detection | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Hantschel, Thomas | |
dc.contributor.imecauthor | Vandervorst, Wilfried | |
dc.contributor.orcidimec | Hantschel, Thomas::0000-0001-9476-4084 | |
dc.source.peerreview | yes | |
dc.source.conference | 19th Ion Beam Analysis Conference - IBA | |
dc.source.conferencedate | 7/09/2009 | |
dc.source.conferencelocation | Cambridge UK | |
imec.availability | Published - imec | |