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Extended defect related excess low-frequency noise in Si junction diodes
Publication:
Extended defect related excess low-frequency noise in Si junction diodes
Date
1996
Proceedings Paper
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1465.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Vanhellemont, Jan
;
Bosman, Gijs
;
Czerwinsky, A.
;
Claeys, Cor
Journal
Abstract
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1981
since deposited on 2021-09-29
Acq. date: 2025-10-24
Citations
Metrics
Views
1981
since deposited on 2021-09-29
Acq. date: 2025-10-24
Citations