Authors

Simoen, Eddy; Vanhellemont, Jan; Bosman, Gijs; Czerwinsky, A.; Claeys, Cor

Conference

Defect Recognition and Image Processing in Semiconductors - DRIP. Proceedings of the 6th International Conference

Title

Extended defect related excess low-frequency noise in Si junction diodes

Publication type

Proceedings paper

Embargo date

9999-12-31