Show simple item record

Low-frequency noise sources related to processing-induced extended defects in Si devices

dc.contributor.authorSimoen, Eddy
dc.contributor.authorVanhellemont, Jan
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-09-29T15:26:51Z
dc.date.available2021-09-29T15:26:51Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1495
dc.sourceIIOimport
dc.titleLow-frequency noise sources related to processing-induced extended defects in Si devices
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage403
dc.source.endpage408
dc.source.conferenceProceedings of the 6th Autumn Meeting Gettering and Defect Engineering in Semiconductor Technology - GADEST'95
dc.source.conferencedate2/09/1995
dc.source.conferencelocationBerlin Germany
imec.availabilityPublished - open access
imec.internalnotesSolid State Phenomena; Vol. 47-48


Files in this item

Thumbnail
Name:
1468.pdf
Size:
320.8Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record