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Static and low frequency noise characterization of FinFET devices

dc.contributor.authorBennamane, K.
dc.contributor.authorBoutchacha, T.
dc.contributor.authorGhibaudo, G.
dc.contributor.authorMouis, M.
dc.contributor.authorCollaert, Nadine
dc.date.accessioned2021-10-17T21:22:04Z
dc.date.available2021-10-17T21:22:04Z
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14975
dc.sourceIIOimport
dc.titleStatic and low frequency noise characterization of FinFET devices
dc.typeProceedings paper
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage39
dc.source.endpage42
dc.source.conference10th International Conference on Ultimate Integration of Silicon - ULIS
dc.source.conferencedate18/03/2009
dc.source.conferencelocationAachen Germany
imec.availabilityPublished - open access


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