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Analytical solution of the switching trap model for negative bias temperature stress

dc.contributor.authorBindu, B.
dc.contributor.authorGoes, Wolfgang
dc.contributor.authorKaczer, Ben
dc.contributor.authorGrasser, Tibor
dc.date.accessioned2021-10-17T21:24:23Z
dc.date.available2021-10-17T21:24:23Z
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15004
dc.sourceIIOimport
dc.titleAnalytical solution of the switching trap model for negative bias temperature stress
dc.typeProceedings paper
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.source.peerreviewyes
dc.source.conferenceIEEE Integrated Reliability Workshop - IIRW
dc.source.conferencedate18/10/2009
dc.source.conferencelocationLake Tahoe, CA USA
imec.availabilityPublished - imec


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