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On the interface state density at InGaAs/oxide interfaces

dc.contributor.authorBrammertz, Guy
dc.contributor.authorLin, Dennis
dc.contributor.authorCaymax, Matty
dc.contributor.authorMeuris, Marc
dc.contributor.authorHeyns, Marc
dc.contributor.authorPasslack, Matthias
dc.date.accessioned2021-10-17T21:27:41Z
dc.date.available2021-10-17T21:27:41Z
dc.date.issued2009
dc.identifier.issn0003-6951
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15037
dc.sourceIIOimport
dc.titleOn the interface state density at InGaAs/oxide interfaces
dc.typeJournal article
dc.contributor.imecauthorBrammertz, Guy
dc.contributor.imecauthorLin, Dennis
dc.contributor.imecauthorCaymax, Matty
dc.contributor.imecauthorMeuris, Marc
dc.contributor.imecauthorHeyns, Marc
dc.contributor.imecauthorPasslack, Matthias
dc.contributor.orcidimecBrammertz, Guy::0000-0003-1404-7339
dc.contributor.orcidimecMeuris, Marc::0000-0002-9580-6810
dc.source.peerreviewyes
dc.source.beginpage202109
dc.source.journalApplied Physics Letters
dc.source.issue20
dc.source.volume95
dc.identifier.urlhttp://scitation.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=APPLAB000095000020202109000001&idtype=cvips&prog=normal
imec.availabilityPublished - imec


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