On the interface state density at InGaAs/oxide interfaces

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Authors

Brammertz, Guy; Lin, Dennis; Caymax, Matty; Meuris, Marc; Heyns, Marc; Passlack, Matthias

ISSN

0003-6951

Issue

20

Journal

Applied Physics Letters

Volume

95

Title

On the interface state density at InGaAs/oxide interfaces

Publication type

Journal article

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