Publication:

On the interface state density at InGaAs/oxide interfaces

Date

2009
Journal article
Simple item page Full metadata Statistics
 
dc.contributor.authorBrammertz, Guy
dc.contributor.authorLin, Dennis
dc.contributor.authorCaymax, Matty
dc.contributor.authorMeuris, Marc
dc.contributor.authorHeyns, Marc
dc.contributor.authorPasslack, Matthias
dc.contributor.imecauthorBrammertz, Guy
dc.contributor.imecauthorLin, Dennis
dc.contributor.imecauthorCaymax, Matty
dc.contributor.imecauthorMeuris, Marc
dc.contributor.imecauthorHeyns, Marc
dc.contributor.imecauthorPasslack, Matthias
dc.contributor.orcidimecBrammertz, Guy::0000-0003-1404-7339
dc.contributor.orcidimecMeuris, Marc::0000-0002-9580-6810
dc.date.accessioned2021-10-17T21:27:41Z
dc.date.available2021-10-17T21:27:41Z
dc.date.issued2009
dc.identifier.issn0003-6951
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15037
dc.identifier.urlhttp://scitation.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=APPLAB000095000020202109000001&idtype=cvips&prog=normal
dc.source.beginpage202109
dc.source.issue20
dc.source.journalApplied Physics Letters
dc.source.volume95
dc.title

On the interface state density at InGaAs/oxide interfaces

dc.typeJournal article
dspace.entity.typePublication
Files
Publication available in collections:
Articles