dc.contributor.author | Brammertz, Guy | |
dc.contributor.author | Lin, H.C. | |
dc.contributor.author | Martens, Koen | |
dc.contributor.author | Alian, AliReza | |
dc.contributor.author | Merckling, Clement | |
dc.contributor.author | Penaud, Julien | |
dc.contributor.author | Kohen, David | |
dc.contributor.author | Wang, Wei-E | |
dc.contributor.author | Sioncke, Sonja | |
dc.contributor.author | Delabie, Annelies | |
dc.contributor.author | Meuris, Marc | |
dc.contributor.author | Caymax, Matty | |
dc.contributor.author | Heyns, Marc | |
dc.date.accessioned | 2021-10-17T21:27:57Z | |
dc.date.available | 2021-10-17T21:27:57Z | |
dc.date.issued | 2009 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/15039 | |
dc.source | IIOimport | |
dc.title | Electrical properties of III-V/oxide interfaces | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Brammertz, Guy | |
dc.contributor.imecauthor | Martens, Koen | |
dc.contributor.imecauthor | Alian, AliReza | |
dc.contributor.imecauthor | Merckling, Clement | |
dc.contributor.imecauthor | Delabie, Annelies | |
dc.contributor.imecauthor | Meuris, Marc | |
dc.contributor.imecauthor | Caymax, Matty | |
dc.contributor.imecauthor | Heyns, Marc | |
dc.contributor.orcidimec | Brammertz, Guy::0000-0003-1404-7339 | |
dc.contributor.orcidimec | Martens, Koen::0000-0001-7135-5536 | |
dc.contributor.orcidimec | Merckling, Clement::0000-0003-3084-2543 | |
dc.contributor.orcidimec | Meuris, Marc::0000-0002-9580-6810 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 375 | |
dc.source.endpage | 386 | |
dc.source.conference | Graphene and Emerging Materials for Post-CMOS Applications | |
dc.source.conferencedate | 24/05/2009 | |
dc.source.conferencelocation | San Francisco, CA USA | |
imec.availability | Published - open access | |
imec.internalnotes | ECS Transactions; Vol. 19, Iss. 5 | |