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A methodology to predict the impact of substrate noise in analog/RF systems

dc.contributor.authorBronckers, Stephane
dc.contributor.authorScheir, Karen
dc.contributor.authorVandersteen, Gerd
dc.contributor.authorVan der Plas, Geert
dc.contributor.authorRolain, Yves
dc.date.accessioned2021-10-17T21:28:31Z
dc.date.available2021-10-17T21:28:31Z
dc.date.issued2009
dc.identifier.issn0278-0070
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15044
dc.sourceIIOimport
dc.titleA methodology to predict the impact of substrate noise in analog/RF systems
dc.typeJournal article
dc.contributor.imecauthorVandersteen, Gerd
dc.contributor.imecauthorVan der Plas, Geert
dc.contributor.orcidimecVan der Plas, Geert::0000-0002-4975-6672
dc.source.peerreviewyes
dc.source.beginpage1613
dc.source.endpage1626
dc.source.journalIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
dc.source.issue11
dc.source.volume28
imec.availabilityPublished - imec


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