A methodology to predict the impact of substrate noise in analog/RF systems

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Authors

Bronckers, Stephane; Scheir, Karen; Vandersteen, Gerd; Van der Plas, Geert; Rolain, Yves

ISSN

0278-0070

Issue

11

Journal

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volume

28

Title

A methodology to predict the impact of substrate noise in analog/RF systems

Publication type

Journal article

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