A methodology to predict the impact of substrate noise in analog/RF systems

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Author(s)

Bronckers, Stephane

;

;

Vandersteen, Gerd

;

Van der Plas, Geert

;

Journal

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Metrics

1933 since deposited on 2021-10-17

Acq. date: 2025-10-23