Publication:
A methodology to predict the impact of substrate noise in analog/RF systems
Date
| dc.contributor.author | Bronckers, Stephane | |
| dc.contributor.author | Scheir, Karen | |
| dc.contributor.author | Vandersteen, Gerd | |
| dc.contributor.author | Van der Plas, Geert | |
| dc.contributor.author | Rolain, Yves | |
| dc.contributor.imecauthor | Vandersteen, Gerd | |
| dc.contributor.imecauthor | Van der Plas, Geert | |
| dc.contributor.orcidimec | Van der Plas, Geert::0000-0002-4975-6672 | |
| dc.date.accessioned | 2021-10-17T21:28:31Z | |
| dc.date.available | 2021-10-17T21:28:31Z | |
| dc.date.issued | 2009 | |
| dc.identifier.issn | 0278-0070 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/15044 | |
| dc.source.beginpage | 1613 | |
| dc.source.endpage | 1626 | |
| dc.source.issue | 11 | |
| dc.source.journal | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems | |
| dc.source.volume | 28 | |
| dc.title | A methodology to predict the impact of substrate noise in analog/RF systems | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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