Application of substrate noise simulation methodology to 3D-stacking

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Authors
Bronckers, Stephane; Van der Plas, Geert; Marchal, Pol; Rolain, Yves
Conference
Design, Automation and Test in Europe Conference - DATE: Workshop on 3D Integration (W5)
Title
Application of substrate noise simulation methodology to 3D-stacking
Publication type
Oral presentation
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