dc.contributor.author | Caymax, Matty | |
dc.contributor.author | Eneman, Geert | |
dc.contributor.author | Bellenger, Florence | |
dc.contributor.author | Merckling, Clement | |
dc.contributor.author | Delabie, Annelies | |
dc.contributor.author | Wang, Gang | |
dc.contributor.author | Loo, Roger | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Mitard, Jerome | |
dc.contributor.author | De Jaeger, Brice | |
dc.contributor.author | Hellings, Geert | |
dc.contributor.author | De Meyer, Kristin | |
dc.contributor.author | Meuris, Marc | |
dc.contributor.author | Heyns, Marc | |
dc.date.accessioned | 2021-10-17T21:31:39Z | |
dc.date.available | 2021-10-17T21:31:39Z | |
dc.date.issued | 2009 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/15069 | |
dc.source | IIOimport | |
dc.title | Germanium for advanced CMOS anno 2009: a SWOT analysis | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Caymax, Matty | |
dc.contributor.imecauthor | Eneman, Geert | |
dc.contributor.imecauthor | Merckling, Clement | |
dc.contributor.imecauthor | Delabie, Annelies | |
dc.contributor.imecauthor | Loo, Roger | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.imecauthor | Mitard, Jerome | |
dc.contributor.imecauthor | De Jaeger, Brice | |
dc.contributor.imecauthor | Hellings, Geert | |
dc.contributor.imecauthor | De Meyer, Kristin | |
dc.contributor.imecauthor | Meuris, Marc | |
dc.contributor.imecauthor | Heyns, Marc | |
dc.contributor.orcidimec | Eneman, Geert::0000-0002-5849-3384 | |
dc.contributor.orcidimec | Merckling, Clement::0000-0003-3084-2543 | |
dc.contributor.orcidimec | Loo, Roger::0000-0003-3513-6058 | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.contributor.orcidimec | Mitard, Jerome::0000-0002-7422-079X | |
dc.contributor.orcidimec | De Jaeger, Brice::0000-0001-8804-7556 | |
dc.contributor.orcidimec | Hellings, Geert::0000-0002-5376-2119 | |
dc.contributor.orcidimec | Meuris, Marc::0000-0002-9580-6810 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 461 | |
dc.source.endpage | 464 | |
dc.source.conference | IEEE International Electron Devices Meeting - IEDM | |
dc.source.conferencedate | 7/12/2009 | |
dc.source.conferencelocation | Baltimore, MD USA | |
imec.availability | Published - imec | |