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Reducing surface reflectivity below 10% by nano-features on random pyramid textured silicon wafers

dc.contributor.authorChan, BT
dc.contributor.authorGong, Chun
dc.contributor.authorJohn, Joachim
dc.contributor.authorVan Kerschaver, Emmanuel
dc.contributor.authorPoortmans, Jef
dc.date.accessioned2021-10-17T21:32:42Z
dc.date.available2021-10-17T21:32:42Z
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15077
dc.sourceIIOimport
dc.titleReducing surface reflectivity below 10% by nano-features on random pyramid textured silicon wafers
dc.typeProceedings paper
dc.contributor.imecauthorChan, BT
dc.contributor.imecauthorJohn, Joachim
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.orcidimecChan, BT::0000-0003-2890-0388
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage108
dc.source.conference19th International Photovoltaic Science and Engineering Conference and Exhibition - PVSEC
dc.source.conferencedate9/11/2009
dc.source.conferencelocationJeju Korea
imec.availabilityPublished - open access


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