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Intrinsic localization property of SERS demonstrated by electron beam induced deposition

dc.contributor.authorChen, Chang
dc.contributor.authorVan Dorpe, Pol
dc.contributor.authorHutchison, James
dc.contributor.authorClemente, Francesca
dc.contributor.authorKox, Ronald
dc.contributor.authorUJi-i, Hiroshi
dc.contributor.authorHofkens, Johan
dc.contributor.authorLagae, Liesbet
dc.contributor.authorMaes, Guido
dc.contributor.authorBorghs, Gustaaf
dc.date.accessioned2021-10-17T21:33:35Z
dc.date.available2021-10-17T21:33:35Z
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15083
dc.sourceIIOimport
dc.titleIntrinsic localization property of SERS demonstrated by electron beam induced deposition
dc.typeOral presentation
dc.contributor.imecauthorVan Dorpe, Pol
dc.contributor.imecauthorLagae, Liesbet
dc.contributor.imecauthorBorghs, Gustaaf
dc.contributor.orcidimecVan Dorpe, Pol::0000-0003-0918-1664
dc.source.peerreviewno
dc.source.conference35th International Conference on Micro & Nano Engineering - MNE
dc.source.conferencedate28/09/2009
dc.source.conferencelocationGent Belgium
imec.availabilityPublished - imec


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