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Hierarchical test generation with built-in fault diagnosis

dc.contributor.authorStroobandt, Dirk
dc.contributor.authorVan Campenhout, Jan
dc.date.accessioned2021-09-29T15:28:59Z
dc.date.available2021-09-29T15:28:59Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1510
dc.sourceIIOimport
dc.titleHierarchical test generation with built-in fault diagnosis
dc.typeProceedings paper
dc.source.peerreviewno
dc.source.beginpage22
dc.source.endpage28
dc.source.conferenceProceedings of the 5th Asian Test Symposium; November 1996. Los Alamitos, Calif., USA.
dc.source.conferencelocation
imec.availabilityPublished - imec


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