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Reliability performance characterization of SOI FinFETs
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Authors
Claeys, Cor
;
Put, Sofie
;
Rafi, J.M.
;
Pavanello, J.M.
;
Martino, J.A.
;
Simoen, Eddy
Conference
2nd International Workshop on Electron Devices and Semiconductor Technology - IEDST
Title
Reliability performance characterization of SOI FinFETs
Publication type
Proceedings paper
Embargo date
9999-12-31
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