Toggle navigation
My submissions
Login
Toggle navigation
View item
imec Publications Repository
imec Publications
Conference contributions
View item
imec Publications Repository
imec Publications
Conference contributions
View item
JavaScript is disabled for your browser. Some features of this site may not work without it.
Functionality, yield and reliability analysis of SiGe micro-mirrors using automated optical measurement techniques
Metadata
Show full item record
Authors
De Wolf, Ingrid
;
De Coster, Jeroen
;
Varela Pedreira, Olalla
;
Haspeslagh, Luc
;
Witvrouw, Ann
Conference
7th ISTC/CSTIC
Title
Functionality, yield and reliability analysis of SiGe micro-mirrors using automated optical measurement techniques
Publication type
Proceedings paper
Collections
Conference contributions
Search imec Publications Repository
This collection
Browse
All of imec Publications Repository
Collections
Publication date
Authors
Titles
Subjects
imec author
Availability
Publication type
This collection
Publication date
Authors
Titles
Subjects
imec author
Availability
Publication type
My account
login