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Conference contributions
Functionality, yield and reliability analysis of SiGe micro-mirrors using automated optical measurement techniques
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Functionality, yield and reliability analysis of SiGe micro-mirrors using automated optical measurement techniques
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Date
2009
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
De Wolf, Ingrid
;
De Coster, Jeroen
;
Varela Pedreira, Olalla
;
Haspeslagh, Luc
;
Witvrouw, Ann
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Statistics
Views
1838
since deposited on 2021-10-17
3
last month
Acq. date: 2026-02-25
Citations