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The Study of the Influence of the Layer Resistivity of Thin Epitaxial Si Cells

dc.contributor.authorEvrard, Olivier
dc.contributor.authorVermeulen, Tom
dc.contributor.authorPoortmans, Jef
dc.contributor.authorCaymax, Matty
dc.contributor.authorLaermans, Patrick
dc.contributor.authorNijs, Johan
dc.contributor.authorMertens, Robert
dc.date.accessioned2021-09-29T12:41:12Z
dc.date.available2021-09-29T12:41:12Z
dc.date.issued1994
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/151
dc.sourceIIOimport
dc.titleThe Study of the Influence of the Layer Resistivity of Thin Epitaxial Si Cells
dc.typeProceedings paper
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.imecauthorCaymax, Matty
dc.contributor.imecauthorLaermans, Patrick
dc.contributor.imecauthorMertens, Robert
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.source.peerreviewno
dc.source.beginpage1567
dc.source.endpage1570
dc.source.conference1st World Conference on Photovoltaic Energy Conversion. Conference Record of the 24thIEEE Photovoltaic Specialists Conference
dc.source.conferencedate5/12/1994
dc.source.conferencelocationWaikoloa, HI USA
imec.availabilityPublished - imec


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