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The Shear test as interface characterization tool applied to the Si-BCB interface

dc.contributor.authorDegryse, Dominiek
dc.contributor.authorVandevelde, Bart
dc.contributor.authorBeyne, Eric
dc.contributor.authorDegrieck, Joris
dc.date.accessioned2021-10-17T21:54:00Z
dc.date.available2021-10-17T21:54:00Z
dc.date.issued2009
dc.identifier.issn1043-7398
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15213
dc.sourceIIOimport
dc.titleThe Shear test as interface characterization tool applied to the Si-BCB interface
dc.typeJournal article
dc.contributor.imecauthorVandevelde, Bart
dc.contributor.imecauthorBeyne, Eric
dc.contributor.orcidimecVandevelde, Bart::0000-0002-6753-6438
dc.contributor.orcidimecBeyne, Eric::0000-0002-3096-050X
dc.source.peerreviewyes
dc.source.beginpage41003
dc.source.journalJournal of Electronic Packaging
dc.source.issue4
dc.source.volume131
imec.availabilityPublished - imec


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